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The Charge-Based Flicker Noise Model for HEMTs:
Luo, Haorui
;
Yan, Xu
;
Hu, Wenrui
.
IEEE Microwave and Wireless Components Letters. 32 (2022) 2 - p. 125-128 , 2022
Link:
https://doi.org/10.1109/lmwc.2021.3118708
RT Journal T1 <Title>The Charge-Based Flicker Noise Model for HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_lmwc.2021.3118708&Exemplar=1&LAN=DE A1 Luo, Haorui A1 Yan, Xu A1 Hu, Wenrui A1 Guo, Yongxin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1531-1309 SN 1558-1764 JF IEEE Microwave and Wireless Components Letters VO 32 IS 2 SP 125 OP 128 LK http://dx.doi.org/https://doi.org/10.1109/lmwc.2021.3118708 DO https://doi.org/10.1109/lmwc.2021.3118708 SF ELIB - SuUB Bremen
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