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Reducing the Number of Measurements of a Multiport Circuit ..:
Chien, Yung-Chi
;
Liu, Hsu-Wei
;
Wu, Tzong-Lin
IEEE Microwave and Wireless Technology Letters. 33 (2023) 2 - p. 115-117 , 2023
Link:
https://doi.org/10.1109/lmwc.2022.3215290
RT Journal T1 <Title>Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_lmwc.2022.3215290&Exemplar=1&LAN=DE A1 Chien, Yung-Chi A1 Liu, Hsu-Wei A1 Wu, Tzong-Lin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2771-9588 SN 2771-957X JF IEEE Microwave and Wireless Technology Letters VO 33 IS 2 SP 115 OP 117 LK http://dx.doi.org/https://doi.org/10.1109/lmwc.2022.3215290 DO https://doi.org/10.1109/lmwc.2022.3215290 SF ELIB - SuUB Bremen
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