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1 Ergebnisse
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Millimeter-Wave Device Characterization Under Wideband Modu..:
Ben Ayed, Ahmed
;
Mitran, Patrick
;
Boumaiza, Slim
IEEE Microwave and Wireless Technology Letters. 34 (2024) 6 - p. 821-824 , 2024
Link:
https://doi.org/10.1109/lmwt.2024.3383335
RT Journal T1 <Title>Millimeter-Wave Device Characterization Under Wideband Modulated Signals Using Vector Network Analyzer Frequency Extenders</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_lmwt.2024.3383335&Exemplar=1&LAN=DE A1 Ben Ayed, Ahmed A1 Mitran, Patrick A1 Boumaiza, Slim PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2771-9588 SN 2771-957X JF IEEE Microwave and Wireless Technology Letters VO 34 IS 6 SP 821 OP 824 LK http://dx.doi.org/https://doi.org/10.1109/lmwt.2024.3383335 DO https://doi.org/10.1109/lmwt.2024.3383335 SF ELIB - SuUB Bremen
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