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1 Ergebnisse
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Analysis and Optimization of Order Overlap in Echelle Imagi..:
Zhang, Lei
;
Li, Bo
;
Li, Hanshuang
...
IEEE Photonics Technology Letters. 36 (2024) 5 - p. 341-344 , 2024
Link:
https://doi.org/10.1109/lpt.2023.3348806
RT Journal T1 <Title>Analysis and Optimization of Order Overlap in Echelle Imaging Spectrometers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_lpt.2023.3348806&Exemplar=1&LAN=DE A1 Zhang, Lei A1 Li, Bo A1 Li, Hanshuang A1 Gu, Guochao A1 Wang, Xiaoxu A1 Kong, Xiangjin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1041-1135 SN 1941-0174 JF IEEE Photonics Technology Letters VO 36 IS 5 SP 341 OP 344 LK http://dx.doi.org/https://doi.org/10.1109/lpt.2023.3348806 DO https://doi.org/10.1109/lpt.2023.3348806 SF ELIB - SuUB Bremen
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