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1 Ergebnisse
1
Spatio-Temporal Anomaly Detection for Substrate Strip Bin M..:
Shen, Po-Cheng
;
Lu, Meng-Xiu
;
Lee, Chia-Yen
IEEE Robotics and Automation Letters. 7 (2022) 4 - p. 9493-9500 , 2022
Link:
https://doi.org/10.1109/lra.2022.3191185
RT Journal T1
Spatio-Temporal Anomaly Detection for Substrate Strip Bin Map in Semiconductor Assembly Process
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_lra.2022.3191185&Exemplar=1&LAN=DE A1 Shen, Po-Cheng A1 Lu, Meng-Xiu A1 Lee, Chia-Yen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 2377-3766 SN 2377-3774 JF IEEE Robotics and Automation Letters VO 7 IS 4 SP 9493 OP 9500 LK http://dx.doi.org/https://doi.org/10.1109/lra.2022.3191185 DO https://doi.org/10.1109/lra.2022.3191185 SF ELIB - SuUB Bremen
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