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Bring Your Own Device: An overview of risk assessment:
Ogie, Robert
IEEE Consumer Electronics Magazine. 5 (2016) 1 - p. 114-119 , 2016
Link:
https://doi.org/10.1109/mce.2015.2484858
RT Journal T1 <Title>Bring Your Own Device: An overview of risk assessment</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mce.2015.2484858&Exemplar=1&LAN=DE A1 Ogie, Robert PB Institute of Electrical and Electronics Engineers (IEEE) YR 2016 SN 2162-2248 SN 2162-2256 JF IEEE Consumer Electronics Magazine VO 5 IS 1 SP 114 OP 119 LK http://dx.doi.org/https://doi.org/10.1109/mce.2015.2484858 DO https://doi.org/10.1109/mce.2015.2484858 SF ELIB - SuUB Bremen
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