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1 Ergebnisse
1
Single-Event Coupling Soft Errors in Nanoscale CMOS Circuit:
Sayil, Selahattin
;
Yeddula, Sumanth R.
;
Juyu Wang
IEEE Design & Test. 30 (2013) 6 - p. 89-97 , 2013
Link:
https://doi.org/10.1109/mdat.2013.2261432
RT Journal T1
Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mdat.2013.2261432&Exemplar=1&LAN=DE A1 Sayil, Selahattin A1 Yeddula, Sumanth R. A1 Juyu Wang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2013 SN 2168-2356 SN 2168-2364 JF IEEE Design & Test VO 30 IS 6 SP 89 OP 97 LK http://dx.doi.org/https://doi.org/10.1109/mdat.2013.2261432 DO https://doi.org/10.1109/mdat.2013.2261432 SF ELIB - SuUB Bremen
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