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Enhancing yield at the end of the technology roadmap:
Naran Sirisantana
;
Paul, B.C.
;
Kaushik Roy
IEEE Design and Test of Computers. 21 (2004) 6 - p. 563-571 , 2004
Link:
https://doi.org/10.1109/mdt.2004.86
RT Journal T1 <Title>Enhancing yield at the end of the technology roadmap</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mdt.2004.86&Exemplar=1&LAN=DE A1 Naran Sirisantana A1 Paul, B.C. A1 Kaushik Roy PB Institute of Electrical and Electronics Engineers (IEEE) YR 2004 SN 0740-7475 JF IEEE Design and Test of Computers VO 21 IS 6 SP 563 OP 571 LK http://dx.doi.org/https://doi.org/10.1109/mdt.2004.86 DO https://doi.org/10.1109/mdt.2004.86 SF ELIB - SuUB Bremen
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