I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Test consideration for nanometer-scale CMOS circuits:

Kaushik Roy ; Mak, T.M. ; Cheng, K.-T.
IEEE Design & Test of Computers.  23 (2006)  2 - p. 128-136 , 2006
Link: https://doi.org/10.1109/mdt.2006.52