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In-System Silicon Validation and Debug:
Abramovici, Miron
IEEE Design & Test of Computers. 25 (2008) 3 - p. 216-223 , 2008
Link:
https://doi.org/10.1109/mdt.2008.77
RT Journal T1 <Title>In-System Silicon Validation and Debug</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mdt.2008.77&Exemplar=1&LAN=DE A1 Abramovici, Miron PB Institute of Electrical and Electronics Engineers (IEEE) YR 2008 SN 0740-7475 JF IEEE Design & Test of Computers VO 25 IS 3 SP 216 OP 223 LK http://dx.doi.org/https://doi.org/10.1109/mdt.2008.77 DO https://doi.org/10.1109/mdt.2008.77 SF ELIB - SuUB Bremen
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