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1 Ergebnisse
1
Leakage Power Contributor Modeling:
Dhanwada, Nagu
;
Hathaway, David
;
Frenkil, Jerry
..
IEEE Design & Test of Computers. 29 (2012) 2 - p. 71-78 , 2012
Link:
https://doi.org/10.1109/mdt.2012.2183573
RT Journal T1 <Title>Leakage Power Contributor Modeling</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mdt.2012.2183573&Exemplar=1&LAN=DE A1 Dhanwada, Nagu A1 Hathaway, David A1 Frenkil, Jerry A1 Davis, W. Rhett A1 Demircioglu, Harun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2012 SN 0740-7475 JF IEEE Design & Test of Computers VO 29 IS 2 SP 71 OP 78 LK http://dx.doi.org/https://doi.org/10.1109/mdt.2012.2183573 DO https://doi.org/10.1109/mdt.2012.2183573 SF ELIB - SuUB Bremen
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