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Testing of Stuck-Open Faults in Nanometer Technologies:
Champac, Victor
;
Vazquez Hernandez, Julio
;
Barcelo, Salvador
...
IEEE Design & Test of Computers. 29 (2012) 4 - p. 80-91 , 2012
Link:
https://doi.org/10.1109/mdt.2012.2205609
RT Journal T1
Testing of Stuck-Open Faults in Nanometer Technologies
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mdt.2012.2205609&Exemplar=1&LAN=DE A1 Champac, Victor A1 Vazquez Hernandez, Julio A1 Barcelo, Salvador A1 Gomez, Roberto A1 Hawkins, Chuck A1 Segura, Jaume PB Institute of Electrical and Electronics Engineers (IEEE) YR 2012 SN 0740-7475 JF IEEE Design & Test of Computers VO 29 IS 4 SP 80 OP 91 LK http://dx.doi.org/https://doi.org/10.1109/mdt.2012.2205609 DO https://doi.org/10.1109/mdt.2012.2205609 SF ELIB - SuUB Bremen
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