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Examination of contaminant-induced faults in connectors:
Zeng, Hua
;
Hubing, Todd
IEEE Electromagnetic Compatibility Magazine. 1 (2012) 4 - p. 47-52 , 2012
Link:
https://doi.org/10.1109/memc.2012.6397057
RT Journal T1 <Title>Examination of contaminant-induced faults in connectors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_memc.2012.6397057&Exemplar=1&LAN=DE A1 Zeng, Hua A1 Hubing, Todd PB Institute of Electrical and Electronics Engineers (IEEE) YR 2012 SN 2162-2264 SN 2162-2272 JF IEEE Electromagnetic Compatibility Magazine VO 1 IS 4 SP 47 OP 52 LK http://dx.doi.org/https://doi.org/10.1109/memc.2012.6397057 DO https://doi.org/10.1109/memc.2012.6397057 SF ELIB - SuUB Bremen
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