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Editorial: I&M around the world:
Van Moer, Wendy
IEEE Instrumentation & Measurement Magazine. 22 (2019) 2 - p. 2-2 , 2019
Link:
https://doi.org/10.1109/mim.2019.8674625
RT Journal T1 <Title>Editorial: I&M around the world</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mim.2019.8674625&Exemplar=1&LAN=DE A1 Van Moer, Wendy PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 1094-6969 SN 1941-0123 JF IEEE Instrumentation & Measurement Magazine VO 22 IS 2 SP 2 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/mim.2019.8674625 DO https://doi.org/10.1109/mim.2019.8674625 SF ELIB - SuUB Bremen
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