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President's message: Special issue highlighting AUTOTESTCON..:
Baglio, Salvo
;
Downing, Walter
IEEE Instrumentation & Measurement Magazine. 23 (2020) 5 - p. 2-2 , 2020
Link:
https://doi.org/10.1109/mim.2020.9153466
RT Journal T1 <Title>President's message: Special issue highlighting AUTOTESTCON 2019</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mim.2020.9153466&Exemplar=1&LAN=DE A1 Baglio, Salvo A1 Downing, Walter PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 1094-6969 SN 1941-0123 JF IEEE Instrumentation & Measurement Magazine VO 23 IS 5 SP 2 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/mim.2020.9153466 DO https://doi.org/10.1109/mim.2020.9153466 SF ELIB - SuUB Bremen
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