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Trends & Controversies:
Nijholt, Anton
;
Arkin, Ronald C.
;
Brault, Sebastien
...
IEEE Intelligent Systems. 27 (2012) 6 - p. 60-75 , 2012
Link:
https://doi.org/10.1109/mis.2012.116
RT Journal T1 <Title>Trends & Controversies</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mis.2012.116&Exemplar=1&LAN=DE A1 Nijholt, Anton A1 Arkin, Ronald C. A1 Brault, Sebastien A1 Kulpa, Richard A1 Multon, Franck A1 Bideau, Benoit A1 Traum, David A1 Hung, Hayley A1 Santos, Eugene A1 Li, Deqing A1 Yu, Fei A1 Zhou, Lina A1 Zhang, Dongsong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2012 SN 1541-1672 JF IEEE Intelligent Systems VO 27 IS 6 SP 60 OP 75 LK http://dx.doi.org/https://doi.org/10.1109/mis.2012.116 DO https://doi.org/10.1109/mis.2012.116 SF ELIB - SuUB Bremen
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