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1 Ergebnisse
1
The Breakthrough Memory Solutions for Improved Performance ..:
Kim, Byeongho
;
Cha, Sanghoon
;
Park, Sangsoo
...
IEEE Micro. 44 (2024) 3 - p. 40-48 , 2024
Link:
https://doi.org/10.1109/mm.2024.3375352
RT Journal T1 <Title>The Breakthrough Memory Solutions for Improved Performance on LLM Inference</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mm.2024.3375352&Exemplar=1&LAN=DE A1 Kim, Byeongho A1 Cha, Sanghoon A1 Park, Sangsoo A1 Lee, Jieun A1 Lee, Sukhan A1 Kang, Shin-haeng A1 So, Jinin A1 Kim, Kyungsoo A1 Jung, Jin A1 Lee, Jong-Geon A1 Lee, Sunjung A1 Paik, Yoonah A1 Kim, Hyeonsu A1 Kim, Jin-Seong A1 Lee, Won-Jo A1 Ro, Yuhwan A1 Cho, YeonGon A1 Kim, Jin Hyun A1 Song, JoonHo A1 Yu, Jaehoon A1 Lee, Seungwon A1 Cho, Jeonghyeon A1 Sohn, Kyomin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0272-1732 SN 1937-4143 JF IEEE Micro VO 44 IS 3 SP 40 OP 48 LK http://dx.doi.org/https://doi.org/10.1109/mm.2024.3375352 DO https://doi.org/10.1109/mm.2024.3375352 SF ELIB - SuUB Bremen
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