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IMS2016 Special and Focus Sessions:
Chen, Morgan
;
Kennan, Wayne
IEEE Microwave Magazine. 17 (2016) 4 - p. 26-27 , 2016
Link:
https://doi.org/10.1109/mmm.2015.2514197
RT Journal T1 <Title>IMS2016 Special and Focus Sessions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_mmm.2015.2514197&Exemplar=1&LAN=DE A1 Chen, Morgan A1 Kennan, Wayne PB Institute of Electrical and Electronics Engineers (IEEE) YR 2016 SN 1527-3342 SN 1557-9581 JF IEEE Microwave Magazine VO 17 IS 4 SP 26 OP 27 LK http://dx.doi.org/https://doi.org/10.1109/mmm.2015.2514197 DO https://doi.org/10.1109/mmm.2015.2514197 SF ELIB - SuUB Bremen
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