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1 Ergebnisse
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Extending RIS Life Span for Reliable Communication Under Ha..:
Mondal, Atiquzzaman
;
Ghosh, Shyamal
;
Singh, Keshav
..
IEEE Open Journal of the Communications Society. 5 (2024) - p. 3395-3409 , 2024
Link:
https://doi.org/10.1109/ojcoms.2024.3406340
RT Journal T1 <Title>Extending RIS Life Span for Reliable Communication Under Hardware Ageing Effects</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ojcoms.2024.3406340&Exemplar=1&LAN=DE A1 Mondal, Atiquzzaman A1 Ghosh, Shyamal A1 Singh, Keshav A1 Biswas, Sudip A1 Duong, Trung Q. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2644-125X JF IEEE Open Journal of the Communications Society VO 5 SP 3395 OP 3409 LK http://dx.doi.org/https://doi.org/10.1109/ojcoms.2024.3406340 DO https://doi.org/10.1109/ojcoms.2024.3406340 SF ELIB - SuUB Bremen
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