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1 Ergebnisse
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Characterization and De-Embedding of Wafer Probe Radiation ..:
Zheng, Ziyang
;
Zhang, Yueping
IEEE Transactions on Antennas and Propagation. 71 (2023) 12 - p. 9440-9453 , 2023
Link:
https://doi.org/10.1109/tap.2023.3319077
RT Journal T1 <Title>Characterization and De-Embedding of Wafer Probe Radiation for Integrated Antenna Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tap.2023.3319077&Exemplar=1&LAN=DE A1 Zheng, Ziyang A1 Zhang, Yueping PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-926X SN 1558-2221 JF IEEE Transactions on Antennas and Propagation VO 71 IS 12 SP 9440 OP 9453 LK http://dx.doi.org/https://doi.org/10.1109/tap.2023.3319077 DO https://doi.org/10.1109/tap.2023.3319077 SF ELIB - SuUB Bremen
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