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1 Ergebnisse
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Degradation Due to Flatwise and Edgewise Bending on Critica..:
Osamura, K.
;
Yamade, S.
;
Kato, T.
IEEE Transactions on Applied Superconductivity. 32 (2022) 6 - p. 1-5 , 2022
Link:
https://doi.org/10.1109/tasc.2022.3153752
RT Journal T1 <Title>Degradation Due to Flatwise and Edgewise Bending on Critical Current of BSCCO Tapes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tasc.2022.3153752&Exemplar=1&LAN=DE A1 Osamura, K. A1 Yamade, S. A1 Kato, T. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1051-8223 SN 1558-2515 SN 2378-7074 JF IEEE Transactions on Applied Superconductivity VO 32 IS 6 SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/tasc.2022.3153752 DO https://doi.org/10.1109/tasc.2022.3153752 SF ELIB - SuUB Bremen
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