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DC Fault Current Limiting Characteristics of Flux-Lock Type..:

Ko, Seok-Cheol ; Han, Tae-Hee ; Lim, Sung-Hun
IEEE Transactions on Applied Superconductivity.  33 (2023)  5 - p. 1-6 , 2023
Link: https://doi.org/10.1109/tasc.2023.3253467