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1 Ergebnisse
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Nanowire-Aware Routing Considering High Cut Mask Complexity:
Su, Yu-Hsuan
;
Chang, Yao-Wen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36 (2017) 6 - p. 964-977 , 2017
Link:
https://doi.org/10.1109/tcad.2016.2614777
RT Journal T1 <Title>Nanowire-Aware Routing Considering High Cut Mask Complexity</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2016.2614777&Exemplar=1&LAN=DE A1 Su, Yu-Hsuan A1 Chang, Yao-Wen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2017 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems VO 36 IS 6 SP 964 OP 977 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2016.2614777 DO https://doi.org/10.1109/tcad.2016.2614777 SF ELIB - SuUB Bremen
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