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eWASM: Practical Software Fault Isolation for Reliable Embe..:

Peach, Gregor ; Pan, Runyu ; Wu, Zhuoyi...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  39 (2020)  11 - p. 3492-3505 , 2020
Link: https://doi.org/10.1109/tcad.2020.3012647