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C-Testing and Efficient Fault Localization for AI Accelerat..:

Chaudhuri, Arjun ; Liu, Chunsheng ; Fan, Xiaoxin.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  41 (2022)  7 - p. 2348-2361 , 2022
Link: https://doi.org/10.1109/tcad.2021.3107401