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1 Ergebnisse
1
C-Testing and Efficient Fault Localization for AI Accelerat..:
Chaudhuri, Arjun
;
Liu, Chunsheng
;
Fan, Xiaoxin
.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41 (2022) 7 - p. 2348-2361 , 2022
Link:
https://doi.org/10.1109/tcad.2021.3107401
RT Journal T1
C-Testing and Efficient Fault Localization for AI Accelerators
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2021.3107401&Exemplar=1&LAN=DE A1 Chaudhuri, Arjun A1 Liu, Chunsheng A1 Fan, Xiaoxin A1 Chakrabarty, Krishnendu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems VO 41 IS 7 SP 2348 OP 2361 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2021.3107401 DO https://doi.org/10.1109/tcad.2021.3107401 SF ELIB - SuUB Bremen
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