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1 Ergebnisse
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Optimal Program-Read Schemes Toward Highly Reliable Open Bl..:
Jia, Menghua
;
Kong, Yachen
;
Zhan, Xuepeng
...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41 (2022) 11 - p. 4797-4807 , 2022
Link:
https://doi.org/10.1109/tcad.2021.3134900
RT Journal T1 <Title>Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2021.3134900&Exemplar=1&LAN=DE A1 Jia, Menghua A1 Kong, Yachen A1 Zhan, Xuepeng A1 Zhang, Meng A1 Wu, Fei A1 Chen, Jiezhi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems VO 41 IS 11 SP 4797 OP 4807 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2021.3134900 DO https://doi.org/10.1109/tcad.2021.3134900 SF ELIB - SuUB Bremen
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