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Robust Compact Model of High-Voltage MOSFET's Drift Region:

Pahwa, Girish ; Sharma, Ayushi ; Goel, Ravi...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  1 - p. 337-340 , 2023
Link: https://doi.org/10.1109/tcad.2022.3172599