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Drain-to-Drain Abutment-Aware Detailed Placement Refinement..:

Xie, Yu-Jin ; Mak, Wai-Kei
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  4 - p. 1255-1267 , 2023
Link: https://doi.org/10.1109/tcad.2022.3194816