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The Dark Side: Security and Reliability Concerns in Machine..:

Xie, Zhiyao ; Pan, Jingyu ; Chang, Chen-Chia..
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  4 - p. 1171-1184 , 2023
Link: https://doi.org/10.1109/tcad.2022.3199172