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Benchmarking of Machine Learning Methods for Multiscale The..:

Coenen, David ; Oprins, Herman ; Degraeve, Robin.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  7 - p. 2264-2275 , 2023
Link: https://doi.org/10.1109/tcad.2022.3216549