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1 Ergebnisse
1
Machine Learning-Based Read Access Yield Estimation and Des..:
Yoon, Taehwan
;
Jeong, Hanwool
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 8 - p. 2618-2630 , 2023
Link:
https://doi.org/10.1109/tcad.2022.3225066
RT Journal T1
Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2022.3225066&Exemplar=1&LAN=DE A1 Yoon, Taehwan A1 Jeong, Hanwool PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems VO 42 IS 8 SP 2618 OP 2630 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2022.3225066 DO https://doi.org/10.1109/tcad.2022.3225066 SF ELIB - SuUB Bremen
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