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STRAIT: Self-Test and Self-Recovery for AI Accelerator:

Lee, Hayoung ; Kim, Jihye ; Park, Jongho.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  9 - p. 3092-3104 , 2023
Link: https://doi.org/10.1109/tcad.2023.3236875