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1 Ergebnisse
1
STRAIT: Self-Test and Self-Recovery for AI Accelerator:
Lee, Hayoung
;
Kim, Jihye
;
Park, Jongho
.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 9 - p. 3092-3104 , 2023
Link:
https://doi.org/10.1109/tcad.2023.3236875
RT Journal T1
STRAIT: Self-Test and Self-Recovery for AI Accelerator
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2023.3236875&Exemplar=1&LAN=DE A1 Lee, Hayoung A1 Kim, Jihye A1 Park, Jongho A1 Kang, Sungho PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems VO 42 IS 9 SP 3092 OP 3104 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2023.3236875 DO https://doi.org/10.1109/tcad.2023.3236875 SF ELIB - SuUB Bremen
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