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1 Ergebnisse
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Boosting Latent Defect Coverage in Automotive Mixed-Signal ..:
Xama, Nektar
;
Gomez, Jhon
;
Dobbelaere, Wim
...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 10 - p. 3426-3435 , 2023
Link:
https://doi.org/10.1109/tcad.2023.3244892
RT Journal T1 <Title>Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2023.3244892&Exemplar=1&LAN=DE A1 Xama, Nektar A1 Gomez, Jhon A1 Dobbelaere, Wim A1 Vanhooren, Ronny A1 Coyette, Anthony A1 Gielen, Georges PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems VO 42 IS 10 SP 3426 OP 3435 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2023.3244892 DO https://doi.org/10.1109/tcad.2023.3244892 SF ELIB - SuUB Bremen
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