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Toward Critical Flip-Flop Identification for Soft-Error Tol..:

Lu, Li ; Chen, Junchao ; Ulbricht, Markus.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  43 (2024)  4 - p. 1135-1148 , 2024
Link: https://doi.org/10.1109/tcad.2023.3331968