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1 Ergebnisse
1
An MIV Test Method Using High Precision Voltage Dividers:
Xiao, Ziwen
;
Yang, Zhiming
;
Yu, Yang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. , 2024
Link:
https://doi.org/10.1109/tcad.2024.3385332
RT Journal T1 <Title>An MIV Test Method Using High Precision Voltage Dividers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcad.2024.3385332&Exemplar=1&LAN=DE A1 Xiao, Ziwen A1 Yang, Zhiming A1 Yu, Yang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0278-0070 SN 1937-4151 JF IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/tcad.2024.3385332 DO https://doi.org/10.1109/tcad.2024.3385332 SF ELIB - SuUB Bremen
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