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1 Ergebnisse
1
Effective Adversarial Examples Detection Improves Screw Det..:
Tseng, Fan-Hsun
;
Zeng, Jiang-Yi
;
Chen, Chi-Yuan
.
IEEE Transactions on Consumer Electronics. 70 (2024) 1 - p. 1963-1971 , 2024
Link:
https://doi.org/10.1109/tce.2023.3325363
RT Journal T1
Effective Adversarial Examples Detection Improves Screw Detection in Dust Pollution Within Industry System
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tce.2023.3325363&Exemplar=1&LAN=DE A1 Tseng, Fan-Hsun A1 Zeng, Jiang-Yi A1 Chen, Chi-Yuan A1 Cho, Hsin-Hung PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0098-3063 SN 1558-4127 JF IEEE Transactions on Consumer Electronics VO 70 IS 1 SP 1963 OP 1971 LK http://dx.doi.org/https://doi.org/10.1109/tce.2023.3325363 DO https://doi.org/10.1109/tce.2023.3325363 SF ELIB - SuUB Bremen
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