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1 Ergebnisse
1
Exploiting Feature Layer for Read Reference Voltage Optimiz..:
Wei, Debao
;
Piao, Zhelong
;
Liu, Ming
...
IEEE Transactions on Consumer Electronics. 70 (2024) 1 - p. 433-444 , 2024
Link:
https://doi.org/10.1109/tce.2023.3332888
RT Journal T1 <Title>Exploiting Feature Layer for Read Reference Voltage Optimization on 3-D NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tce.2023.3332888&Exemplar=1&LAN=DE A1 Wei, Debao A1 Piao, Zhelong A1 Liu, Ming A1 Zeng, Yanlong A1 Feng, Hua A1 Qiao, Liyan A1 Peng, Xiyuan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0098-3063 SN 1558-4127 JF IEEE Transactions on Consumer Electronics VO 70 IS 1 SP 433 OP 444 LK http://dx.doi.org/https://doi.org/10.1109/tce.2023.3332888 DO https://doi.org/10.1109/tce.2023.3332888 SF ELIB - SuUB Bremen
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