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1 Ergebnisse
1
Robust Text Image Tampering Localization via Forgery Traces..:
Dong, Li
;
Liang, Weipeng
;
Wang, Rangding
IEEE Transactions on Consumer Electronics. 70 (2024) 1 - p. 3495-3507 , 2024
Link:
https://doi.org/10.1109/tce.2024.3367947
RT Journal T1 <Title>Robust Text Image Tampering Localization via Forgery Traces Enhancement and Multiscale Attention</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tce.2024.3367947&Exemplar=1&LAN=DE A1 Dong, Li A1 Liang, Weipeng A1 Wang, Rangding PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0098-3063 SN 1558-4127 JF IEEE Transactions on Consumer Electronics VO 70 IS 1 SP 3495 OP 3507 LK http://dx.doi.org/https://doi.org/10.1109/tce.2024.3367947 DO https://doi.org/10.1109/tce.2024.3367947 SF ELIB - SuUB Bremen
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