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1 Ergebnisse
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Reliability Inspection for Bilayer Nanosilver Paste Ensembl..:
Zhang, Xiaobin
;
Zhao, Xiaoliang
;
Li, Wei
...
IEEE Transactions on Components, Packaging and Manufacturing Technology. 13 (2023) 2 - p. 188-196 , 2023
Link:
https://doi.org/10.1109/tcpmt.2023.3243737
RT Journal T1 <Title>Reliability Inspection for Bilayer Nanosilver Paste Ensemble Pressureless Sintered Embedded Cooling SiC Power Module</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcpmt.2023.3243737&Exemplar=1&LAN=DE A1 Zhang, Xiaobin A1 Zhao, Xiaoliang A1 Li, Wei A1 Wang, Zhenyu A1 Liao, Anmou A1 Song, Yunqian A1 Wang, Yujun A1 Wang, Yun A1 Zhang, Lijun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2156-3950 SN 2156-3985 JF IEEE Transactions on Components, Packaging and Manufacturing Technology VO 13 IS 2 SP 188 OP 196 LK http://dx.doi.org/https://doi.org/10.1109/tcpmt.2023.3243737 DO https://doi.org/10.1109/tcpmt.2023.3243737 SF ELIB - SuUB Bremen
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