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Efficient Characterization of Interconnects With Arbitrary ..:
Bosman, Dries
;
Huynen, Martijn
;
De Zutter, Daniël
...
IEEE Transactions on Components, Packaging and Manufacturing Technology. 13 (2023) 10 - p. 1567-1575 , 2023
Link:
https://doi.org/10.1109/tcpmt.2023.3303101
RT Journal T1 <Title>Efficient Characterization of Interconnects With Arbitrary Polygonal Cross Sections Using Fokas-Derived Dirichlet-to-Neumann Operators</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcpmt.2023.3303101&Exemplar=1&LAN=DE A1 Bosman, Dries A1 Huynen, Martijn A1 De Zutter, Daniël A1 Sun, Xiao A1 Pantano, Nicolas A1 Van der Plas, Geert A1 Beyne, Eric A1 Ginste, Dries Vande PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2156-3950 SN 2156-3985 JF IEEE Transactions on Components, Packaging and Manufacturing Technology VO 13 IS 10 SP 1567 OP 1575 LK http://dx.doi.org/https://doi.org/10.1109/tcpmt.2023.3303101 DO https://doi.org/10.1109/tcpmt.2023.3303101 SF ELIB - SuUB Bremen
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