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1 Ergebnisse
1
Protection Degree and Migration in the Stochastic SIRS Mode..:
Li, Yuhan
;
Zeng, Ziyan
;
Feng, Minyu
.
IEEE Transactions on Circuits and Systems I: Regular Papers. 69 (2022) 2 - p. 771-783 , 2022
Link:
https://doi.org/10.1109/tcsi.2021.3119978
RT Journal T1
Protection Degree and Migration in the Stochastic SIRS Model: A Queueing System Perspective
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2021.3119978&Exemplar=1&LAN=DE A1 Li, Yuhan A1 Zeng, Ziyan A1 Feng, Minyu A1 Kurths, Jurgen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 69 IS 2 SP 771 OP 783 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2021.3119978 DO https://doi.org/10.1109/tcsi.2021.3119978 SF ELIB - SuUB Bremen
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