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Protection Degree and Migration in the Stochastic SIRS Mode..:

Li, Yuhan ; Zeng, Ziyan ; Feng, Minyu.
IEEE Transactions on Circuits and Systems I: Regular Papers.  69 (2022)  2 - p. 771-783 , 2022
Link: https://doi.org/10.1109/tcsi.2021.3119978