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Voltage Boosted Fail Detecting Circuit for Selective Write ..:

Park, Jaehyun ; Lee, Sangheon ; Jeong, Hanwool
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  2 - p. 797-805 , 2023
Link: https://doi.org/10.1109/tcsi.2022.3226464