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1 Ergebnisse
1
Voltage Boosted Fail Detecting Circuit for Selective Write ..:
Park, Jaehyun
;
Lee, Sangheon
;
Jeong, Hanwool
IEEE Transactions on Circuits and Systems I: Regular Papers. 70 (2023) 2 - p. 797-805 , 2023
Link:
https://doi.org/10.1109/tcsi.2022.3226464
RT Journal T1
Voltage Boosted Fail Detecting Circuit for Selective Write Assist and Cell Current Boosting for High-Density Low-Power SRAM
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2022.3226464&Exemplar=1&LAN=DE A1 Park, Jaehyun A1 Lee, Sangheon A1 Jeong, Hanwool PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 70 IS 2 SP 797 OP 805 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2022.3226464 DO https://doi.org/10.1109/tcsi.2022.3226464 SF ELIB - SuUB Bremen
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