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1 Ergebnisse
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Cross-Layer Reliability Modeling of Dual-Port FeFET: Device..:
Kumar, Shubham
;
Chatterjee, Swetaki
;
Thomann, Simon
..
IEEE Transactions on Circuits and Systems I: Regular Papers. 70 (2023) 7 - p. 2891-2903 , 2023
Link:
https://doi.org/10.1109/tcsi.2023.3265427
RT Journal T1 <Title>Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2023.3265427&Exemplar=1&LAN=DE A1 Kumar, Shubham A1 Chatterjee, Swetaki A1 Thomann, Simon A1 Chauhan, Yogesh Singh A1 Amrouch, Hussam PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 70 IS 7 SP 2891 OP 2903 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2023.3265427 DO https://doi.org/10.1109/tcsi.2023.3265427 SF ELIB - SuUB Bremen
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