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Modeling and Predicting Transistor Aging Under Workload Dep..:
Genssler, Paul R.
;
Barkam, Hamza E.
;
Pandaram, Karthik
..
IEEE Transactions on Circuits and Systems I: Regular Papers. 70 (2023) 9 - p. 3699-3711 , 2023
Link:
https://doi.org/10.1109/tcsi.2023.3289325
RT Journal T1 <Title>Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2023.3289325&Exemplar=1&LAN=DE A1 Genssler, Paul R. A1 Barkam, Hamza E. A1 Pandaram, Karthik A1 Imani, Mohsen A1 Amrouch, Hussam PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 70 IS 9 SP 3699 OP 3711 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2023.3289325 DO https://doi.org/10.1109/tcsi.2023.3289325 SF ELIB - SuUB Bremen
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