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1 Ergebnisse
1
Steady-State Cascading Failure Model With Voltage Instabili..:
Li, Meixuan Jade
;
Tse, Chi K.
;
Yi, Ming
IEEE Transactions on Circuits and Systems I: Regular Papers. 71 (2024) 1 - p. 463-472 , 2024
Link:
https://doi.org/10.1109/tcsi.2023.3324575
RT Journal T1 <Title>Steady-State Cascading Failure Model With Voltage Instability Event Detection</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2023.3324575&Exemplar=1&LAN=DE A1 Li, Meixuan Jade A1 Tse, Chi K. A1 Yi, Ming PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 71 IS 1 SP 463 OP 472 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2023.3324575 DO https://doi.org/10.1109/tcsi.2023.3324575 SF ELIB - SuUB Bremen
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