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1 Ergebnisse
1
Machine Learning Methodologies to Predict the Results of Si..:
Lu, Li
;
Chen, Junchao
;
Ulbricht, Markus
.
IEEE Transactions on Circuits and Systems I: Regular Papers. 71 (2024) 5 - p. 1978-1991 , 2024
Link:
https://doi.org/10.1109/tcsi.2024.3349928
RT Journal T1 <Title>Machine Learning Methodologies to Predict the Results of Simulation-Based Fault Injection</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2024.3349928&Exemplar=1&LAN=DE A1 Lu, Li A1 Chen, Junchao A1 Ulbricht, Markus A1 Krstic, Milos PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 71 IS 5 SP 1978 OP 1991 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2024.3349928 DO https://doi.org/10.1109/tcsi.2024.3349928 SF ELIB - SuUB Bremen
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