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1 Ergebnisse
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Clock Period-Jitter Measurement With Low-Noise Runtime Cali..:
Wang, Jinn-Shyan
;
Chou, Pei-Yuan
IEEE Transactions on Circuits and Systems I: Regular Papers. 71 (2024) 7 - p. 3157-3164 , 2024
Link:
https://doi.org/10.1109/tcsi.2024.3375396
RT Journal T1 <Title>Clock Period-Jitter Measurement With Low-Noise Runtime Calibration for Chips in FinFET CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2024.3375396&Exemplar=1&LAN=DE A1 Wang, Jinn-Shyan A1 Chou, Pei-Yuan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 71 IS 7 SP 3157 OP 3164 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2024.3375396 DO https://doi.org/10.1109/tcsi.2024.3375396 SF ELIB - SuUB Bremen
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