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1 Ergebnisse
1
Low-Overhead Triple-Node-Upset Self-Recoverable Latch Desig..:
Chen, Xin
;
Bai, Yuxin
;
Cai, Hao
...
IEEE Transactions on Circuits and Systems I: Regular Papers. 71 (2024) 6 - p. 2632-2645 , 2024
Link:
https://doi.org/10.1109/tcsi.2024.3382988
RT Journal T1 <Title>Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsi.2024.3382988&Exemplar=1&LAN=DE A1 Chen, Xin A1 Bai, Yuxin A1 Cai, Hao A1 Zhu, Congyi A1 Zhou, Xinjie A1 Zhang, Ying A1 Liu, Weiqiang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1549-8328 SN 1558-0806 JF IEEE Transactions on Circuits and Systems I: Regular Papers VO 71 IS 6 SP 2632 OP 2645 LK http://dx.doi.org/https://doi.org/10.1109/tcsi.2024.3382988 DO https://doi.org/10.1109/tcsi.2024.3382988 SF ELIB - SuUB Bremen
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