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Reliable Test Architecture With Test Cost Reduction for Sys..:

Ibtesam, Muhammad ; Solangi, Umair Saeed ; Kim, Jinuk..
IEEE Transactions on Circuits and Systems II: Express Briefs.  69 (2022)  3 - p. 1537-1541 , 2022
Link: https://doi.org/10.1109/tcsii.2021.3108415