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The Impact of Soft Errors in Memory Units of Edge Devices E..:

Abich, Geancarlo ; Garibotti, Rafael ; Reis, Ricardo.
IEEE Transactions on Circuits and Systems II: Express Briefs.  69 (2022)  3 - p. 679-683 , 2022
Link: https://doi.org/10.1109/tcsii.2022.3141243